1. Advanced calculations for defects in materials
پدیدآورنده : / edited by Audrius Alkauskas ...[et al]
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Materials, Testing, Mathematical models,Semiconductors, Materials, Testing
رده :
TA410
.
A379
2011
2. Advanced calculations for defects in materials : electronic structure methods
پدیدآورنده : edited by Audrius Alkauskas ...]et al[
کتابخانه: Library of Razi Metallurgical Research Center (Tehran)
موضوع : Testing Mathematical models ، Materials,Materials Testing ، Semiconductors
رده :
TA
410
.
A379
2011
3. Beam injection assessment of defects in semiconductors
پدیدآورنده : / edited by M. Kittler...(et al)
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors- Defects- Congresses,Semiconductors- Defects- Testing
رده :
QC10
.
J1I421
1998
4. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
پدیدآورنده : \ Andrei Pavlov, Manoj Sachdev
کتابخانه: Library of Foreign Languages and Islamic Sources (Qom)
موضوع : Metal oxide semiconductors, Complementary -- Design. ,Random access memory.,نیمه هادی‌های اکسید فلزی مکمل -- طراحی ,حافظه دسترسی تصادفی
رده :
E-Book
,
5. CMOS SRAM circuit design and parametric test in nano-scaled technologies
پدیدآورنده : / Andrei Pavlov, Manoj Sachdev
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Metal oxide semiconductors, Complementar--Design,Random access memory,Nanoelectronics
رده :
E-BOOK
6. CMOS SRAM circuit design and parametric test in nano-scaled technologies :process-aware SRAM design and test
پدیدآورنده : Pavlov, Andrei
کتابخانه: Library of Razi Metallurgical Research Center (Tehran)
موضوع : Design ، Metal oxide semiconductors, Complementary,، Random access memory,، Nanoelectronics
رده :
TK
7871
.
99
.
M44P38
2008
7. CMOS analog circuit design /
پدیدآورنده : Phillip E. Allen, Douglas R. Holberg
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Linear integrated circuits,Metal oxide semiconductors, Complementary
رده :
TK7874
.
A428
2012
8. CMOS analog circuit design [electronic resource]
پدیدآورنده : / Phillip E. Allen, Douglas R. Holberg
کتابخانه: Imam Reza International University library and information center (Khorasan Razavi)
موضوع : Linear integrated circuits,Metal oxide semiconductors, Complementary,TECHNOLOGY & ENGINEERING / Engineering (General).--bisacsh,TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated.--bisacsh
رده :
EB
,
TK7874
.
A428
2012
9. Characterization of metals and materials
پدیدآورنده :
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Materials,Metal- insulator transitions,Thin film- Surface- Analysis,Foam materials,Metal insulator semiconductors,Altrasonic--Testing
رده :
TA403
.
C35
2013
10. Characterization of wide bandgap power semiconductor devices /
پدیدآورنده : Fei (Fred) Wang, Zheyu Zhang, and Edward A. Jones.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electric capacity.,Power semiconductors.,Wide gap semiconductors.,capacitance.,Electric capacity.,network topology.,power semiconductor devices.,Power semiconductors.,semiconductor device models.,TECHNOLOGY & ENGINEERING-- Mechanical.,wide band gap semiconductors.,Wide gap semiconductors.
رده :
QC611
.
8
.
W53
W36
2018eb
11. Debye Screening Length.
پدیدآورنده : \ Kamakhya Prasad Ghatak, Sitangshu Bhattacharya
کتابخانه: Library of Foreign Languages and Islamic Sources (Qom)
موضوع : Nanostructured materials,موادنانوساختار,a01,a01,Semiconductors -- Testing -- Optical methods.,Thomas-Fermi theory,نیمه‌هادی‌ها -- آزمایش -- روش های نوری
رده :
TA
418
.
9
.
G46D4
2014
E-Book
,
12. Deep-submicron CMOS-ICs :
پدیدآورنده : Harry Veendrick.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Application-specific integrated circuits.,Metal oxide semiconductors, Complementary.,Application-specific integrated circuits.,Metal oxide semiconductors, Complementary.
رده :
TK7871
.
99
.
M44
V44
1998
13. Defect oriented testing for nano metric CMOS vlsi circuits
پدیدآورنده : Sachdev, Manoj.
کتابخانه: Library of Razi Metallurgical Research Center (Tehran)
موضوع : ، Metal oxide semiconductors, Complementary- Testing,، Metal oxide semiconductors, Complementary- Defects
رده :
TK
7871
.
99
.
M44
S23
2007
14. Design and analysis of integrator-based log-domain filter circuits
پدیدآورنده : Gordon W. Roberts and Vincent W. Leung.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electric circuit analysis.,Log domain filters -- Design and construction.,Metal oxide semiconductors, Complementary -- Design and construction.
15. Design-for-test and test optimization techniques for TSV-based 3D stacked ICs
پدیدآورنده : / Brandon Noia, Krishnendu Chakrabarty
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Three-dimensional integrated circuits, Testing,Three-dimensional integrated circuits, Design and construction,Engineering,Circuits and Systems,Processor Architectures,Semiconductors,TECHNOLOGY & ENGINEERING / Mechanical, bisacsh
رده :
E-BOOK
16. Device Physics of Narrow Gap Semiconductors
پدیدآورنده : / Junhao Chu, Arden Sher
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : TESTING& ELECTRONIC|ENGINEERING, MULTIDISCIPLINARY|MATERIALS SCIENCE, CHARACTERIZATION &ENGINEERING, CIVIL|ENGINEERING, ELECTRICAL
رده :
E-BOOK
17. Diagnosis and troubleshooting of automotive electrical, electronic, and computer systems /
پدیدآورنده : James D. Halderman
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Automobiles-- Electric equipment-- Maintenance and repair,Automobiles-- Electronic equipment-- Maintenance and repair
رده :
TL272
.
H223
2012
18. ESD :
پدیدآورنده : Steven H. Voldman
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electric discharges,Electrostatics,Integrated circuits-- Protection,Integrated circuits-- Reliability,Integrated circuits-- Testing,Semiconductors-- Failures
رده :
TK7871
.
852
.
V65
2009
19. Electrical characterization of GaAs materials and devices
پدیدآورنده : David C. Look
موضوع : Gallium arsenide semiconductors - Testing,Magnetoresistance
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
20. Electrical characterization of GaAs materials and devices
پدیدآورنده : Look, David C.
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Testing ، Gallium arsenide semiconductors,Magnetoresistance
رده :
TK
7871
.
15
.
G3
L66
1989
